- SoC Solution
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RTL Design, Platform Design & Verification, FPGA Verification 부터
Design Service 분야의 DFT Insertion, Layout, PKG / Test까지
시스템반도체 개발 및 제작에 필요한 모든 솔루션을 제공합니다.
Design Service Flow
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STEP 1
Spec. Decision
RTL Coding -
STEP 2
Synthesis
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STEP 3
Netlist
Hand-off -
STEP 4
DFT
-
STEP 5
Placement
Routing -
STEP 6
Verification
& PG -
STEP 7
Test Vector
Generation -
STEP 8
Failure
Analysis
Design Service Level
Level |
Spec. Decision |
Synthesis |
DFT |
Placement |
Verification |
Test Vector |
Failure |
---|---|---|---|---|---|---|---|
Level 0
Spec. Hand-off |
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Level 1
RTL Hand-off |
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Level 2
Netlist Hand-off |
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Level 3
GDS Hand-off |
Total Solution
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FULL CHIP DESIGN
( SPEC / DESIGN )Design / Verification Platform
System Architecture Analysis
Power Management Control
Real Emulation with FPGA
IP Supplier Partnership
Device Driver, BSP, OS porting
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PHYSICAL
( SYNTHESIS / DFT )
IMPLEMENTATIONDFT (SCAN / BIST / JTAG)
In-system Test
STA (Static Timing Analysis)
Synthesis & Timing Closure
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PHYSICAL DESIGN
( AUTO P&R )Full Chip Floor Plan
Hierarchical Physical Design
Low Power Design
SI Check
(IR Drop, Crosstalk-Noise) -
PKG & TEST Develop
( Assembly & TEST )Package Design
Test vector generation
ATE test set-up
Qualification & Reliability
Q.A & Failure analysis
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Mass Production
( SCM )Wafer Business
Full Turn-key Business
(Wafer + PKG + TEST)
Advanced Technology
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- AI / HPC
- AI Accelerator, Datacenter, Server, Cloud Computing, Edge AI, XR/AR Processor
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- Automotive
- ADAS, Digital Cockpit, Network Processor, Vision Processor, Automotive MCU
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- Consumer
- High-End Appliances MCU, Printer SoC, Smart Home, Wearable AI Device, AIoT Application
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- Industrial
- Digital Security SoC, AI-Enhanced Surveillance ISP, Smart Mobility, Industrial Robot, Digital Twin
Vision & Mission
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01
SoC Design Solution
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Spec-to-Design
SoC System Design
SoC Verification
SoC FPGA protype
Reliable Design Process
-
02
SoC Design Platform
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SoC System Platform
SoC Verification Platform
SoC FPGA Platform
ARM Partnership
IP Supplier Partnership
Early Start, Fast Optimize
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03
High-Performance Design
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NoC/Memory System Optimization
Maximize Clock Frequency
Hardening for Computing Clusters
Physical Design Consideration
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04
Low-Power Design
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Power Domain Scenario
Design for Dynamic clock-gating
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05
Software Development
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Device Driver, BSP Development
Linux/RTOS Porting
Firmware for FPGA Verification
System Bring-up
SoC Design Solution
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01
SoC DesignSoC/System Architecture
Processing Core
IP/xPU Hardening
Full Chip TOP Integration
PPA Optimization
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02
SoC VerificationIP/System Verification
FPGA Prototyping
Emulation for Architecture
SoC TOP Verification
Sub Platform Verification
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03
Software SolutionSoC Architecture Software Stack
BSP (Board Support Package) to SDK (S/W Development Kit) TF-A (Trusted F/W), OP-TEE (Trusted OS), U-Boot, RTOS (Zephyr), Linux (Device Driver/Tree), Buildroot
System Solution Optimization
Performance Optimization
- SoC System Platform
- ARM-based SoC System : Ready for Entry-to-Cutting Edge
- 3rd Party IP with Partnership
- Early Start and Fast Optimization
- SoC Verification Platform
- Systematic Configured & Re-usable Environment
- All Verification Cases from Top to Sub in One Environment
- Configurable Alternative Models for Integrated Units
- Light and Reliable against Integration Issue
- Easy Porting your System into One Verification Env.
- SoC Design Solution
- FPGA board with SoC System Platform
- Fast Emulation for your IP on SoC System Platform
- Fast Emulation for your System
- Fast Iteration for your IP / System Architecture
Physical
Implementation
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Hardening for
Computing Clusters -
CPU
GPU
NPU
Hash Core
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Physical & Power-aware
Logic Synthesis -
Logic Synthesis with physical information and power scenario
Placement-Aware Multi-Bit Register Banking
Physically aware Clock Gating restructuring
Design for Testability
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Support advanced
DFT solutions -
Low pin count test with serializer
Power Aware DFT
Test Fail Diagnosis
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Memory BIST
(Built-In Self Test) -
Memory BIST/BIRA for higher SRAM yield
Repair solution with eFuse & OTP
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Logic BIST
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hardware based in-field testing method
on-chip generated random patterns for safety and mission critical applications
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In-system test
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for safety-critical applications such as automotive, aerospace, and medicine
Use IST(In-System Test) controller through IJTAG network
to access the chip during operation
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SCAN
(Advanced DFT Skill) -
Scan test for improved test coverage for lower DPPM
Stuck-At, Bridge, Transition, Path-delay, OCCT, Burn-in
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IDDQ Test
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IDDQ test for additional fault coverage
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Boundary Scan
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Inter-chip connection test method for system level testing
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Physical DFT consider
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Physical Reordering and Repartitioning
Physical Design
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Accurate and
robust timing analysis -
LVF based variability library
Moment-based LVF to cope with non-Gaussian effect
Parametric OCV method
CCS/CCSN-based STA
Statistical Rvia STA
NP-Skewed corner STA for hold timing, min-pulse, and DCD check only
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Physical optimization
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BEOL-aware delay optimization (BEOL resistance increase impacting path delay)
Mixed DDB/MDB Flow
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Physical-aware Timing ECO
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Minimize physical side-effect for ECO
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MIM-aware Timing ECO
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Produce a single ECO file for Multiply Instantiated Module
Accelerate multi-core CPU/GPU timing closure
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01
Dynamic Power OptimizationMulti-supply Voltage & Voltage Island
In-Rush Current prevented power gating
Clock/Memory-Gating
Dynamic Voltage Frequency Scaling
Vector-Driven Optimization
Decap pre-placement method
Merge or split ICG / Multi-bit flip-flop
Low Power CTS (Concurrent Clock and
Data Optimization) -
02
Leakage Power OptimizationMulti-Vth Optimization
Gate-Length Biasing
Sign-off Leakage Optimization
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03
Low Power VerificationLow power static rule check
Power-aware Simulation
Power-aware equivalence check
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01
Power Integrity SolutionPower Plan based on Early Prototyping Analysis
Dynamic Voltage Drop Analysis
Static Power Analysis
Power EM / BUMP Current
P/G Resistance check
-
02
Signal Integrity SolutionSignal EM
Glitch Noise analysis
Clock Jitter validation
Duty-cycle distortion methodology
Clock Propagation Check
3-row decap inverter on CTS